Direct Contact Temperature Forcing System

With the Temptronic® ThermoSpot systems, you can easily test the temperature of various integrated circuits, including high-Watt emitting devices. The devices are available as a complete collection of benchtop direct contact systems for highly flexible and practical use. The responsive units on these devices contain a thermal probe that is connected to the main device via a flexible umbilical cord. You can directly mate the thermal probe with the necessary IC under test, using an interchangeable ThermoBridgeTM connection. This creates a highly efficient thermally conductive path to quickly induce temperatures to the device, even under power.

You do not require a lot of expertise to use this testing equipment. Instead, you can easily connect the thermal probe to the DUT using the accurate and handy lock-down mechanism.

The testing equipment is currently available in two different models known as DCP-1 and DCP2 to test the ICs between -65 and 200 degree Celsius.

  • The DCP-1 produces a cooling power of 25W at -40 degree Celsius for low power devices.
  • The DCP-2 produces a cooling power of 25W at -55 degree Celsius and 120W for -40 degree Celsius.
  • DUT Interfacing: available for in-circuit and test socket applications
  • You can control the various aspects of the testing device using a touch-screen controller. These controls include user-programmable temperature, graphing as well as data logging.
  • The compact size of the device allows you to use it for testing over as well as under the test bench.
  • The device produces an excellent, quick as well as an accurate transition for temperature on the DUT control.
Enquiry

Send us an email and we'll get back to you, ASAP.

Questions, issues or concerns? I'd love to help you!

Click ENTER to chat