With years of experience in providing customer-centric solutions, the world-famous company Saunders & Associates has delivered top-of-the-line Frequency Control devices. Their proprietary way of manufacturing and testing the devices has helped them establish new standards of products on a global scale. The excellent engineering team at their organization has tons of experience in fine tuning and testing the devices correctly.

At Globetek, we supply the following Saunders & Associates equipment for the Quartz Crystal and Oscillator manufacturing industries. Feel free to get in touch with our commercial team to know more about these products.

Quartz Crystal Test & Production
Measurement Equipment

Product

250B-1 Network Analyzer
250C 500MHz Network Analyzer
250D 800MHz Network Analyzer
Crystal Test Fixtures (for high drive application)
Crystal Test Fixtures (for leaded, SMD, and crystal blank applications)
Low Frequency/Watch Crystal Measurement Test Fixture
Crystal Measurement Reference Crystal
Automatic Test Systems

Product

W-350D Quartz Crystal Test and Sort System
W-940A Blank Sorter
W-910A SMD Crystal Pallet Test System
Temperature Test Systems

Product

W-2220MR Crystal Temperature Test System
W-2200B Disc Pallet Dual Chamber Temperature Test System
W-2200B Dual Chamber Temperature Test System
W-2200 Bench Top Temperature Test System
W-2200 High Speed TCXO Crystal Temperature Test
W-2200B SMD Disc Pallet Temperature Test System
W-2200 SMD Disc Pallet Temperature Test System
W-2200B Temperature Test System
W-2200 Low Frequency Crystal Disc Pallet Temperature Test System
W-910A W-2200 SMD Crystal Temperature Disc Unloader/Loader
W-910A-01 W-2200 SMD Crystal Temperature Disc Unloader & Sorter
W-910A-02 W-2200 SMD Crystal Temperature Disc Unloader & Sorter
250B Upgrade Kit for 2000 Series Temperature Test Systems
W-2200 Upgrade Kit for Transat TC-100 Temperature Chamber
T-714 Dual Row Crystal Test Wheel
W-2200 Crystal Disc Pallet
HC-49SMD Temperature Test Disc Pallet
Base Electrode Plating
Product
W-5600 Base Plating System
5600 Capacitively Coupled Plasma Option
Final Frequency Adjustment

Product

Dual W-5910iE Quartz Crystal Etching System
Dual W-5910iB Quartz Crystal Etching System
W-5910ie Quartz Crystal Etching System
W-5910iB Quartz Crystal Etching System
W-5910i Quartz Crystal Inline Etching System
W-5910 Quartz Crystal Etching System
W-5710A Leaded/SMD Crystal Plating System
W-5250S Plating System
W-250B/12SA Crystal Plating System
W-900A W-12SA SMD Plating Disc Unloader/Loader
W-250B/6SA Crystal Plating System Upgrade
250B/6SA Dual Plating System Upgrade






Oscillator Test & Production Measurement Equipment

Product

W-280B Oscillator Analyzer
W-280B TCXO Programming Benchtop System
Automatic Test Systems

Product

W-920A SMD Oscillator Pallet Test System
Surface Mount Device Pallet Arrays
Temperature Test Systems

Product

W-2810 TCXO Programming System
W-2800B SMD Disc Pallet Oscillator Temperature Test System
W-2810MR Oscillator Perturbation Test System
W-2810 Oscillator Perturbation Test System
W-2800B Oscillator Disc Pallet
W-902A W-2800 SMD Oscillator Temperature Disc Unloader/Loader
W-902A-01 W-2800 SMD Oscillator Temperature Disc Unloader & Sorter
W-902A-02 W-2800 SMD Oscillator Temperature Disc Unloader/Loader
Final Frequency Adjustment

Product

Dual W-5910iE Quartz Crystal Etching System
Dual W-5910iB Quartz Crystal Etching System
W-5910ie Quartz Crystal Etching System
W-5910iB Quartz Crystal Etching System
W-5920i Oscillator Inline Etching System
W-5920 Oscillator Etching System
W-280A/12SA Oscillator Plating System
W-280A/6SA Oscillator Plating System Upgrade
MCF, SAW and FBAR Test and Production Measurement Equipment

Product

250B-1 Network Analyzer
250C 500MHz Network Analyzer
250D 800MHz Network Analyzer
Automatic Test Systems

Product

W-350D Quartz Crystal Test and Sort System
Temperature Test Systems

Product

W-2200B Temperature Test System
T-714 Dual Row Crystal Test Wheel
W-2200 SMD Disc Pallet Temperature Test System
Final Frequency Adjustment

Product

W-5920 Oscillator Etching System
5500B MCF Plating System
5500B MCF Three Pole Plating System
Discrete Component Test Measurement Equipment

Product

250B-1 220MHz Network Analyzer
250C 500MHz Network Analyzer
Temperature Test Systems

Product

W-2500 Capacitor Test System
W-2500 Resistor Test System
W-2500 Diode Test System
W-2200 Ceramic Resonator Test System
Precision Temperature Test Chambers Round Test Chambers

Product

4220 Temperature Test Chamber
4220MR Temperature Test Chamber
Rectangular Test Chambers

Product

4350MR Temperature Test Chamber
4350 Temperature Test Chamber
4365 Temperature Test Chamber
4366 Temperature Test Chamber
Thin Film Metal Deposition

Product

5600 Deposition System
Capacitively Coupled Plasma Upgrade
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