If you’re validating a semiconductor device that must perform reliably at –40°C during cold starts and +125°C under peak operating conditions, you need to observe electrical behaviour, timing margins, and functional performance at the exact moment the temperature changes.
When electronic components fail in the field, it’s almost always due to repeated exposure to temperature changes. The temperature change has a cascading effect on the strength of materials, solder joints, packaging, or design. This is why thermal testing is so important for reliability in semiconductor and electronics manufacturing.
When evaluating IC socket suppliers for high-frequency testing, the market is divided between generic low-cost solutions and specialized, high-fidelity engineering tools. Globetek provides the latter, through Ironwood Electronics.
The one component common across industrial automation, electric mobility, and renewable energy, which keeps systems safe and efficient is the current sensor.
It was supposed to be an ordinary afternoon. A woman in Kerala pulled into a public charging bay, topped up her EV, and reached to unplug the connector.
When you’re designing a Battery Management System (BMS), choosing the right current sensor isn’t just about specs.
Electric vehicles (EVs) are transforming transportation—but building an EV that goes farther on less energy? That’s an engineering challenge.
If you’re leading a hardware team or building in the semiconductor space in India, then this checklist is for you.
Hall effect sensors are widely used for precise, contactless current measurement in applications ranging from industrial automation to renewable energy systems. LEM, a leading manufacturer of current and voltage sensors, offers both open-loop and closed-loop Hall effect sensors, each with distinct advantages. Open-loop Hall effect sensors offer simpler, cost-effective solutions with wider ranges but lower […]
An IC socket is a device used to electrically connect an Integrated Circuit (IC) to a printed circuit board to verify the IC’s electrical characteristics and assess its reliability. The socket allows for the repeated insertion and removal of multiple ICs, making it suitable for conducting reliability tests iteratively.